Product Overview
   

For SDRAM, DDR1, DDR2, DDR3, FB-DIMM

QFN, DFN
Pad Style Applications
 		  
QFP, SO
Leaded Style Applications		  




Johnstech's Pad Series test contactors deliver flexibility, performance, while lowering
your overall cost of test.
 
Johnstech's Leaded Series performance contactors were the first in the industry
to address the needs of production testing while lowering the overall cost of test.
  Johnstech's patented Edge technology has been enhanced to meet the testing challenges of today's low-voltage, high-speed memory modules.
 



Pad ROL™200 Series
Johnstech's ROL Technology provides excellent performance and prolongs loadboard life for both Gold-Plated and Matte Tin Device Platings. 
 
  Leaded ROL™200 Series
Johnstech's patented ROL technology provides excellent electrical performance and proven mechanical reliability on Leaded Devices. 		  Edge 400a Series
Designed to meet the testing challenges of today's high-speed memory modules.

 
   
   
Pad ROL™100 Series
Designed for those who require high electrical performance.
 
  Leaded ROL™400 Series
Johnstech's ROL™ technology provides excellent electrical and mechanical reliability for high volume production test and manual characterization. 		   
Pad Series 2mm
Delivers Flexibility, performance, 11+ GHz with 0.5nH of self inductance.
 
  Leaded Series 2mm
The industry standard for Leaded Packages in High Performance Test. 		   
Pad Series 1mm
Evaluation Socket
Excellent electrical performance for prototyping and device characterization.
 
 
Leaded Series 4mm
Meets and exceeds the vigorous High Performance Test requirements of the mid-range Analog and Mixed Signal market.
   
 


DL-VCMA
Simple, One-Handed Operation for manual test.

SL-VCMA
Single-Latch Clamshell Design
for manual test.






 
 


VMA
Single-Latch Clamshell Design for manual test. Features include improved ergonomic, thermal, electrical and mechanical performance.