Chip Scale Review November/December 2008 Article - Cost of Test is not the only Factor to Consider in Production Test

BiTS 2006 Award Winning Paper
Best Data Presented
Socket Performance Over Time & Insertion Count with Pb-Free Applications

Understanding How Pb-Free Platings Affect Production-Test Cost, Throughput and Yield

Challenges of Contacting Lead-Free Devices (3.2MB)

RF Wireless and High Speed Digital Test Issues and Your Contactor Supplier (500K)

Orchestrating Four ATE Suppliers To Reduce Test Cost For A High-Volume RF-IC

Optimizing the Whole Test System to Achieve Optimal Yields and Lowest Test Costs (1.6MB)*

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