Application Notes

Johnstech's application notes are provided so that our customers, our engineers, and our customer's other suppliers can all work together to ensure that customer's expectations are met.

How to Measure Pad Devices

How to Measure Leaded Devices

RF & Microwave Wireless ICs - Reduce Risk, Reach the Market Faster with Johnstech Contactors

Test Contactors Meet the Challenges of Precision Analog IC Device Test

Contacting Solutions for Reliable, Repeatable Test Results on NiPdAu Packages

Low-Force XL-2 Contacts for NiPdAu Packages

Multitest 99xx Alignment Tool for Johnstech Pad Series Contactor

Want to Learn More about Test Contactors?

Read Advanced Product Testing of RF, SoC and SiP Devices by Joe Kelly & Michael Engelhardt

Chapter 9 is focused on Test Contactors and was written with the help of Johnstech!

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