Technical Papers

Resolving Test Challenges for High-Speed Interfaces

July 2009

By: Paul F. Scrivens, Johnstech

Resolving test challenges for emerging wireless designs

April 2009
By: Paul F. Scrivens, Johnstech

BiTS 2009
Attendee Choice Award Winner
Pulsed Current-Carrying Capacity of Small Metallic Conductors as applied to Device Test

Chip Scale Review
November/December 2008 Article

Cost of Test is not the only Factor to Consider in Production Test

BiTS 2006 Award Winning Paper
Best Data Presented
Socket Performance Over Time & Insertion Count with Pb-Free Applications

Understanding How Pb-Free Platings Affect Production-Test Cost, Throughput and Yield

Challenges of Contacting Lead-Free Devices

RF Wireless and High Speed Digital Test Issues and Your Contactor Supplier

Orchestrating Four ATE Suppliers To Reduce Test Cost For A High-Volume RF-IC

Optimizing the Whole Test System to Achieve Optimal Yields and Lowest Test Costs *

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