Johnstech

Pad ROL™100A Series Test Contactor

Johnstech Pad ROL™100A Series IC Test Socket
For QFN, DFN, and Other Pad-Style Applications

The Pad ROL™100A offers the best-in-class electrical performance for testing your most demanding RF/microwave communications devices to 40 GHz. Whether you’re performing engineering tests on high gain RF amplifiers, RF transceivers, the latest WiMAX or 3G devices, the Pad ROL™100A delivers. Engineered with robust mechanical performance, the Pad ROL™100A meets your most demanding production needs for higher First Pass Yield, longer MTBA, and lower cost of test. New contact designs for 0.4mm and >0.5mm pitches provide longer contact life and longer MTBA for testing your QFN and DFN matte tin and NiPdAu packages.

ROL™100A Contacts  Device Platings
Gold-Plated Matte Tin & Tin-Based
Low-Force XL-2 Nickel Palladium Gold

Production Test

The self-cleaning wipe action of the “rolling contact” design provides many benefits for Production Test:

  • Consistent Contact Resistance 
  • Optimized Electrical Performance
  • Higher First Pass Yield 
  • Repeatable Site-to-Site Performance
  • Longer MTBA (Mean Time Between Assists)
  • Prolonged Load Board Life
  • Simple Maintenance & Rebuilding
  • Improved OEE (Overall Equipment Efficiency)
  • Lower Overall Cost of Test

Characterization

Pad ROL™100A Contactors are ideal for Manual Device Evaluation, Lab Testing, Prototyping and Characterization.

  • Designed to test to 40 GHz.
  • Reliable and repeatable results
  • Lab Performance correlates to Production Test Floor
  • Robust Manual Actuator life of 10k+ insertions

 

Your Contact for Higher Performance