Pad ROL™100A Test Contactor

Johnstech Pad ROL™100A IC Test Socket
For QFN, DFN, and Other Pad-Style Applications

The Pad ROL™100A offers the best-in-class electrical performance for testing your most demanding RF/microwave communications devices to 40 GHz. Whether you’re performing engineering tests on high gain RF amplifiers, RF transceivers, the latest WiMAX or 3G devices, the Pad ROL™100A delivers. Engineered with robust mechanical performance, the Pad ROL™100A meets your most demanding production needs for higher First Pass Yield, longer MTBA, and lower cost of test. New contact designs for 0.4mm and >0.5mm pitches provide longer contact life and longer MTBA for testing your QFN and DFN matte tin and NiPdAu packages.

ROL™100A Contacts	Device Platings

Gold-Plated	Matte Tin & Tin-Based
Low-Force XL-2	Nickel Palladium Gold

Production Test

The self-cleaning wipe action of the “rolling contact” design provides many benefits for Production Test:

Consistent Contact Resistance
Optimized Electrical Performance
Higher First Pass Yield
Repeatable Site-to-Site Performance
Longer MTBA (Mean Time Between Assists)
Prolonged Load Board Life
Simple Maintenance & Rebuilding
Improved OEE (Overall Equipment Efficiency)
Lower Overall Cost of Test

Characterization

Pad ROL™100A Contactors are ideal for Manual Device Evaluation, Lab Testing, Prototyping and Characterization.

Designed to test to 40 GHz.
Reliable and repeatable results
Lab Performance correlates to Production Test Floor
Robust Manual Actuator life of 10k+ insertions