Product Selector

The most accurate, repeatable and reliable results, test after test.

Superior Test Technology

Johnstech Products

Partner with Johnstech’s seasoned engineering experts—leaders in semiconductor testing since 1991—to optimize every phase of the final test process. From characterization to production, our team leverages patented innovations like the wipe-action scrub mechanism to break through solder oxides, ensuring superior performance and unmatched reliability. We deliver cost-effective, high-quality test solutions that maximize your profits, reduce ownership costs, and elevate equipment effectiveness worldwide.

Product Performance Chart

ROL 100A

80%

ROL 200

37.5%

ROL 200 XT

37.5%

ROL 200KR Force Contact

24.5%

Edge 400A

12.5%

ROL 400

5%
10
20
30
40
50
60
70
80
90
100

Measured Data– Configuration Dependent

XT Series

Test Contactors

Johnstech® XT™ Contactors include a family of test solutions that have been uniquely designed for consistent and stable tri-temp testing reliability. These XT™ Contactors include unique and proprietary, housing and elastomer combinations approved for automotive device testing for temperature ranges from -65°C to +175°C. While primarily focused on automotive applications, XT™ Contactors are ideal for all high or low temperature testing applications.

Reliability Improves Yield
Mechanically Robust
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ES-P™ Series

ESD Sensitive Solutions

Expect superior performance for precision analog, mixed signal, and RF applications that you’ve come to expect from your Johnstech ROL® solutions now available with ES-P™, our technology for housing and alignment plate materials. Proven to <100V and ideal for devices that are susceptible to electrostatic discharge events, the ES-P series does not increase the triboelectric charge in your test system that can damage your device. Take ESD protection to the next level and contact your local Johnstech sales representative for a customized test solution today.

Proven to <100V
No Triboelectric Increase
ESD protection
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Spring Probe

Versatility Meets Reliability

Get Johnstech’s reliability, quality, and service in our newest spring probe solution for the highly competitive array marketplace. This single-ended probe design developed by Johnstech engineers, provides a more consistent CRES performance than traditional pins and is compatibility with floating alignment plates. Spring probe BGA Crown DUT and QFN/LGA Spear tips available.

Pitches down to 0.3mm
Temp Range: -55 to 155°C
Life 500,000 cycles
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Kelvin

More Than Just Precision Measurements

Johnstech's Kelvin-Ready™ design that accommodates field configurable sense contacts to be used for any given I/O, enabling precision Kelvin measurements and test system monitoring feedback loops to improve a wide variety of test objectives. Test engineers are now using Kelvin for improved characterization and removing it when their devices go to production.

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Pad VROL®

Test Contactors

Johnstech’s patented VROL® technology brings excellent electrical performance and proven mechanical reliability for Precision Analog, Mixed Signal and RF device testing.

Consistent Contact Resistance
Improved OEE
Less Frequent Cleaning
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Leaded VROL®

Test Contactors

Johnstech’s patented VROL® technology brings excellent electrical performance and proven mechanical reliability for Precision Analog, Mixed Signal and RF device testing.

Consistent Contact Resistance
Improved OEE
Less Frequent Cleaning
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Pad ROL®

Test Contactors

Johnstech’s patented ROL® technology offers the best-in-class electrical performance for testing your most demanding RF/microwave communications devices to 40 GHz.

Consistent Contact Resistance
Reliable and repeatable results
Higher First Pass Yield
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Leaded ROL®

Test Contactors

Johnstech’s patented ROL® technology brings excellent electrical performance and proven mechanical reliability for Precision Analog, Mixed Signal and RF device testing

Consistent Contact Resistance
Improved OEE
Less Frequent Cleaning
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Memory Module

Series Test Contactors

Johnstech’s patented Edge technology exceeds the testing challenges of today’s low-voltage (1.05-1.8 VDC, 2133-3200 MHz, 3200 MT/S), DDR4 Memory Modules.

Reduced Edge Rate Degradation
Less Noise Incursion
Superior Electrical Performance
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WLCSP

Probe Array

Delivering unsurpassed low and stable contact resistance (CRES) by optimizing among several critical engineered parameters, including effective probe signal transmission path.

Stable, Accurate Test Signals
Lowest CRES
Increase Yields, Less Retest
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  • Point-to-Point
    Communications
    60-70 GHz
  • Satellite Communication
    43.5 GHz
  • Gyro
    Mid-speed Digital
  • Bluetooth
    2.4 GHz
  • Current Regulator
    Low-Speed Analog
  • Manifold Air Pressure Sensor
    Low Speed Analog
  • Voltage Regulator
    Low Speed Analog
  • Radar
    77-81 GHz
  • Tire Pressure Sensor
    Low-Speed Digital